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Orthogonal Defect Classification


What is Orthogonal Defect Classification (ODC)


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Orthogonal Defect Classification (ODC) turns semantic information in the software defect stream into a measurement on the process. The ideas were developed in the late '80s and early '90s by Ram Chillarege at IBM Research. This has led to the development of new analytical methods used for software development and test process analysis. ODC is process model, language and domain independent. Applications of ODC have been reported by several corporations on a variety of platforms and development processes, ranging from waterfall, spiral, gated, and agile development processes. One of the popular applications of ODC is software root cause analysis. ODC is known to reduce the time taken to perform root cause analysis by over a factor of 10. The gains come primarily from a different approach to root cause analysis, where the ODC data is generated rapidly and analytics used for the cause and effect analysis. This shifts the burden of analysis from a purely human method to one that is more data intensive.
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